XPS Workshop: From Measurements to Scientific Answers

Following the success of the previous workshops "Data Fitting with CasaXPS 2011" and "XPS: From data measurement to scientific answers 2013", a new XPS workshop is scheduled for September 26-30, 2016 (4.5 days) at the CNRS conference centre at Roscoff, Brittany, France.  This workshop is entitled "XPS Analysis: From Measurements to Scientific Answers".

Please note, that the workshop will be held in English and is limited to a maximum of 49 people.  Please click here to find out  more information at the workshop web site:

Workshop program:
1) Theoretical courses on XPS spectroscopy and imaging
2) Practical courses with CasaXPS and QUASES-Tougaard Softwares
3) Training sessions with data and videos supplied
4) Brainstorming dedicated to difficult cases

Parallel sessions:
1) One for beginners
2) One for experts

This training is the opportunity:
1) To gain an overview of XPS, ranging from the measuring technique to data interpretation
2) To explore the possibilities of data processing with the software CasaXPS and QUASES-Tougaard Softwares
3) To create a database of examples of experimental data and their XPS analyses
4) To treat difficult experimental cases, proposed by participants

Workshop Instructors Include:
Dr. Neal Fairley, Casa Software Ltd (UK)
Pr. Sven Tougaard, University of Southern Denmark, Odense (Denmark)
Dr. Mark Biesinger, Surface Science Western, University of Western Ontario (Canada)
Dr. John Walton, TSTC Ltd (UK)
Dr. Delphine Flahaut, Assistant professor, Université de Pau et des Pays de L'Adour, (France)
Dr. Vincent Fernandez, Research Engineer (France)