Advanced Materials Characterization
By Igor Bello
This publication is a book on advanced analytical techniques for undergraduate and graduate university study and training of professional engineers and scientists in field of nanomaterials/materials technology, physics, chemistry, microelectronic devices, biomaterials and biology, pharmaceutical industry, and many other fields of science, technology, and engineering. There are hundreds of examples demonstrating the importance of advanced analytical techniques.
The book presents physical principles, explains instrumental hardware, interprets the acquired analytical data, and shows practical applications of individual analytical techniques. Understanding of the book text is indeed the first step toward practical and independent material analysis. Such a comprehensive book in advanced material characterization is unavailable.
The book contains 172 learning questions and answers which promote independence of trainees in material science and engineering. Numerous calculations and data interpretation support the physical and engineering imagination and creativity. Therefore, advanced analytical techniques deserve considerable attention.
Book presents a number of different analytical techniques that are mostly conducted in vacuum. It contains 340 figures, and 15 tables.
The book design is based on professional analysis for industrial and academic customer and long experience in teaching at university levels, particularly advanced materials characterization techniques, optical characterization methods, nondestructive testing, and practical design and construction of operational analytical instruments such as x-ray photoelectron spectroscopy and ion scattering spectrometry.
Although the book was prepared very carefully it is not guaranteed that it is completely free of mistakes. The authors and publisher do not carry any liability for possible mistakes and particularly for incorrect usage of the illustrated systems. The publication focuses on the fundamental understanding of physical principles used in materials characterization. Users and operators are fully responsible for handling their analytical instruments and materials of analysis. Some gas, solid, and powders can be flammable, corrosive, or toxic. Such substances can be handled only with permission by specially trained operators who strictly follow national and local safety regulations.
Chapter 3 Light Electron and Ion Beam Optics
Chapter 4 Scanning Electron Microscopy and Integrated Analyses
Chapter 5 Transmission Electron Microscopy
Chapter 6 Auger Electron Spectroscopy
Chapter 8 X-ray Photoelectron Spectroscopy
Chapter 10 Secondary Ion Mass Spectrometry
Chapter 11 Low Energy Ion Scattering
Chapter 12 Rutherford Backscattering Spectrometry
Chapter 13 Scanning Tunneling Microscopy
