Example of XPS Description for Publications

The following is an example of an XPS analyses description used in the experimental section of a publication. Your description may have to be modified from this somewhat if non-standard conditions were used.

X-ray Photoelectron Spectroscopy Analyses:
The XPS analyses were carried out with a Kratos Axis Ultra spectrometer using a monochromatic Al K(alpha) source (15mA, 14kV). XPS can detect all elements except hydrogen and helium, probes the surface of the sample to a depth of 5-7 nanometres, and has detection limits ranging from 0.1 to 0.5 atomic percent depending on the element. The instrument work function was calibrated to give a binding energy (BE) of 83.96 eV for the Au 4f7/2 line for metallic gold and the spectrometer dispersion was adjusted to give a BE of 932.62 eV for the Cu 2p3/2 line of metallic copper. The Kratos charge neutralizer system was used on all specimens. Survey scan analyses were carried out with an analysis area of 300 x 700 microns and a pass energy of 160 eV. High resolution analyses were carried out with an analysis area of 300 x 700 microns and a pass energy of 20 eV. Spectra have been charge corrected to the main line of the carbon 1s spectrum (adventitious carbon) set to 284.8 eV. Spectra were analysed using CasaXPS software (version 2.3.14).

For other examples see:
[1] M.C. Biesinger, C. Brown, J.R. Mycroft, R.D. Davidson and N.S. McIntyre, Surf. Interface Anal. 36, 1550-83 (2004).
[2] M.C. Biesinger, R. Pollack, B.R. Hart, B.A. Kobe and R. St.C. Smart, Minerals Engineering, 20, 152-162 (2007).
[3] S.C. Ghosh, M.C. Biesinger, R.R. LaPierre and P. Kruse, Journal of Applied Physics, 101, 114322 (2007).