X-ray photoelectron spectroscopy (XPS or ESCA) curve fitting procedures, reference materials and useful notes are listed here to provide a starting point for the consistent interpretation of XPS spectra. These reference pages contain tips and techniques that are designed to help both the novice and advanced XPS user.
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Analyzing TOF-SIMS Spectra in CasaXPS
Researchers at Surface Science Western have been employing the powerful curve-fitting procedures available in CasaXPS to help analyze TOF-SIMS spectra obtained on our Ion-TOF IV time-of-flight secondary ion mass spectrometer. The curve-fitting procedures are useful to help deconvolute overlapping peaks (masses) and comparing peak areas between samples. A procedure for importing and analyzing ToF-SIMS data into CasaXPS has been developed and can be downloaded here.